This feature increases scan volume vertically, allowing to image and analyse larger volumes.
This feature allows us to perform a “Scout” scan to identify interior regions of a low resolution sample and obtain higher resolution “Zoom” scans.
This technique allows us to scan low-Z materials such as biological specimen or polymer materials where there is a distinct difference in refractive indices between regions.
This feature provides flexible side-by-side tuning of two distinct tomographies at different imaging conditions or sample conditions, for e.g. sample scanned at two different energy levels.
This innovative feature High Aspect Ratio Tomography (HART) mode on FDXM provides you with higher throughput imaging for flat samples such as those found with semiconductor packages and boards.
This feature enables us to image materials under variable environments with controlled conditions including over time (4D) to non-destructively characterize and quantify the evolution of 3D microstructures with compression and thermal stages.
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